Derek Wright, Manoj Sachdev. Transistor-Level Fault Analysis and Test Algorithm Development for Ternary Dynamic Content Addressable Memorie. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 39-47, IEEE Computer Society, 2003. [doi]
Abstract is missing.