DFT is all I can afford, who cares about Design for Yield or Design for Reliability!

David M. Wu. DFT is all I can afford, who cares about Design for Yield or Design for Reliability!. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1141-1142, IEEE Computer Society, 1999.

Abstract

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