Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes

Meng-Yen Wu, Meng-Hsueh Chiang. Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes. In 17th International Symposium on Quality Electronic Design, ISQED 2016, Santa Clara, CA, USA, March 15-16, 2016. pages 169-172, IEEE, 2016. [doi]

Abstract

Abstract is missing.