External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

A memory yield improvement scheme combining built-in self-repair and error correction codes

Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang. A memory yield improvement scheme combining built-in self-repair and error correction codes. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-9, IEEE Computer Society, 2012. [doi]

Authors

Tze-Hsin Wu

This author has not been identified. Look up 'Tze-Hsin Wu' in Google

Po-Yuan Chen

This author has not been identified. Look up 'Po-Yuan Chen' in Google

Mincent Lee

This author has not been identified. Look up 'Mincent Lee' in Google

Bin-Yen Lin

This author has not been identified. Look up 'Bin-Yen Lin' in Google

Cheng-Wen Wu

This author has not been identified. Look up 'Cheng-Wen Wu' in Google

Chen-Hung Tien

This author has not been identified. Look up 'Chen-Hung Tien' in Google

Hung-Chih Lin

This author has not been identified. Look up 'Hung-Chih Lin' in Google

Hao Chen

This author has not been identified. It may be one of the following persons: Look up 'Hao Chen' in Google

Ching-Nen Peng

This author has not been identified. Look up 'Ching-Nen Peng' in Google

Min-Jer Wang

This author has not been identified. Look up 'Min-Jer Wang' in Google
runs on