Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang. A memory yield improvement scheme combining built-in self-repair and error correction codes. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-9, IEEE Computer Society, 2012. [doi]
@inproceedings{WuCLLWTLCPW12,
title = {A memory yield improvement scheme combining built-in self-repair and error correction codes},
author = {Tze-Hsin Wu and Po-Yuan Chen and Mincent Lee and Bin-Yen Lin and Cheng-Wen Wu and Chen-Hung Tien and Hung-Chih Lin and Hao Chen and Ching-Nen Peng and Min-Jer Wang},
year = {2012},
doi = {10.1109/TEST.2012.6401576},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401576},
researchr = {https://researchr.org/publication/WuCLLWTLCPW12},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-1594-4},
}