Automatic fabric defect detection using a wide-and-light network

Jun Wu 0014, Juan Le, Zhitao Xiao, Fang Zhang, Lei Geng, Yanbei Liu, Wen Wang. Automatic fabric defect detection using a wide-and-light network. Appl. Intell., 51(7):4945-4961, 2021. [doi]

Abstract

Abstract is missing.