Tai-Chou Wu, Yu-ping Ma, Li-Pin Chang. Flash read disturb management using adaptive cell bit-density with in-place reprogramming. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 325-330, IEEE, 2018. [doi]
@inproceedings{WuMC18,
title = {Flash read disturb management using adaptive cell bit-density with in-place reprogramming},
author = {Tai-Chou Wu and Yu-ping Ma and Li-Pin Chang},
year = {2018},
doi = {10.23919/DATE.2018.8342030},
url = {https://doi.org/10.23919/DATE.2018.8342030},
researchr = {https://researchr.org/publication/WuMC18},
cites = {0},
citedby = {0},
pages = {325-330},
booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
publisher = {IEEE},
isbn = {978-3-9819263-0-9},
}