Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits

David M. Wu, Charles E. Radke. Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. In DAC. pages 291-295, 1991. [doi]

Authors

David M. Wu

This author has not been identified. Look up 'David M. Wu' in Google

Charles E. Radke

This author has not been identified. Look up 'Charles E. Radke' in Google