Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing - researchr publication authors

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Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]

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