Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{WuRMTMYCHK19,
title = {Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing},
author = {Lizhou Wu and Siddharth Rao and Guilherme Cardoso Medeiros and Mottaqiallah Taouil and Erik Jan Marinissen and Farrukh Yasin and Sebastien Couet and Said Hamdioui and Gouri Sankar Kar},
year = {2019},
doi = {10.1109/ETS.2019.8791518},
url = {https://doi.org/10.1109/ETS.2019.8791518},
researchr = {https://researchr.org/publication/WuRMTMYCHK19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1173-5},
}