Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing - researchr publication related

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Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar. Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. In 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019. pages 1-6, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Defect and Fault Modeling Framework for STT-MRAM TestingLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. tetc, 9(2):707-723, 2021. [doi]

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAMLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. date 2021: 1717-1722 [doi]

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test SolutionsLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. itc 2021: 143-152 [doi]

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMsLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. TC, 71(9):2219-2233, 2022. [doi]

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMsLizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. itc 2020: 1-10 [doi]

Electrical Modeling of STT-MRAM DefectsLizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui. itc 2018: 1-10 [doi]

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