Statistical AC Test Coverage

David M. Wu, Charles E. Radke, J. P. Roth. Statistical AC Test Coverage. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 538-541, IEEE Computer Society, 1986.

@inproceedings{WuRR86,
  title = {Statistical AC Test Coverage},
  author = {David M. Wu and Charles E. Radke and J. P. Roth},
  year = {1986},
  tags = {test coverage, testing, e-science, coverage},
  researchr = {https://researchr.org/publication/WuRR86},
  cites = {0},
  citedby = {0},
  pages = {538-541},
  booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
  publisher = {IEEE Computer Society},
}