Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerging Topics Comput., 9(2):707-723, 2021. [doi]
@article{WuRTMFMKH21,
title = {Defect and Fault Modeling Framework for STT-MRAM Testing},
author = {Lizhou Wu and Siddharth Rao and Mottaqiallah Taouil and Guilherme Cardoso Medeiros and Moritz Fieback and Erik Jan Marinissen and Gouri Sankar Kar and Said Hamdioui},
year = {2021},
doi = {10.1109/TETC.2019.2960375},
url = {https://doi.org/10.1109/TETC.2019.2960375},
researchr = {https://researchr.org/publication/WuRTMFMKH21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Emerging Topics Comput.},
volume = {9},
number = {2},
pages = {707-723},
}