Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu. Test compression and logic BIST at your fingertips. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 2, IEEE, 2005. [doi]
Abstract is missing.