Hao Wu, Tianzhen Wang, Mengqi Ni, M. E. H. Benbouzid, Jingang Han, Lan Liu. A longitudinal-standardization multi-period PCA fault detection strategy based-on adaptive confidence limit. In IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, Dallas, TX, USA, October 29 - Nov. 1, 2014. pages 3355-3360, IEEE, 2014. [doi]
Abstract is missing.