Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations

Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen. Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst., 25(5), 2020. [doi]

Abstract

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