Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris. IC laser trimming speed-up through wafer-level spatial correlation modeling. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-7, IEEE, 2014. [doi]
Abstract is missing.