A self-refereed design-for-test structure of CP-PLL for on-chip jitter measurement

Lanhua Xia, Jianhui Wu, Zhikuang Cai. A self-refereed design-for-test structure of CP-PLL for on-chip jitter measurement. IEICE Electronic Express, 15(4):20171215, 2018. [doi]

@article{XiaWC18,
  title = {A self-refereed design-for-test structure of CP-PLL for on-chip jitter measurement},
  author = {Lanhua Xia and Jianhui Wu and Zhikuang Cai},
  year = {2018},
  doi = {10.1587/elex.15.20171215},
  url = {https://doi.org/10.1587/elex.15.20171215},
  researchr = {https://researchr.org/publication/XiaWC18},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {15},
  number = {4},
  pages = {20171215},
}