Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing

Dong Xiang, Jiaming Cai, Bo Liu. Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

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