Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara. Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 12-17, IEEE Computer Society, 2003. [doi]
Abstract is missing.