Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis

Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 86, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.