A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information - researchr publication

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Dong Xiang, Janak H. Patel. A Global Algorithm for the Partial Scan Design Problem Using Circuit State Information. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 548-557, IEEE Computer Society, 1996.

Abstract is missing.

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