A Rapid Temperature Rise Testing Scheme and Device for Low-Voltage Switchgear

Bin Xiang, Hu Xiong, Jiayuan Li, Xiaoguang Jiang, Zhixiong Liu, Jiarui Yang. A Rapid Temperature Rise Testing Scheme and Device for Low-Voltage Switchgear. IEEE Instrum. Meas. Mag., 29(2):38-45, April 2026. [doi]

Abstract

Abstract is missing.