Efficient Analysis of Fault Trees with Voting Gates

Jianwen Xiang, Kazuo Yanoo, Yoshiharu Maeno, Kumiko Tadano, Fumio Machida, Atsushi Kobayashi, Takao Osaki. Efficient Analysis of Fault Trees with Voting Gates. In Tadashi Dohi, Bojan Cukic, editors, IEEE 22nd International Symposium on Software Reliability Engineering, ISSRE 2011, Hiroshima, Japan, November 29 - December 2, 2011. pages 230-239, IEEE, 2011. [doi]

Abstract

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