A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

Dong Xiang, Yang Zhao, Krishnendu Chakrabarty, Hideo Fujiwara. A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(6):999-1012, 2008. [doi]

Abstract

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