Node Switching Rates of Switch-and-Examine Relaying in Rician and Nakagami-m Fading

Chuzhe Xiao, Norman C. Beaulieu. Node Switching Rates of Switch-and-Examine Relaying in Rician and Nakagami-m Fading. In European Wireless 2011, April 27-29, 2011, Vienna, Austria. VDE-Verlag, 2011. [doi]

Abstract

Abstract is missing.