Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM

Cheng Xie, Yueyue Chen, Jianjun Chen, Jizuo Zhang. Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM. Science in China Series F: Information Sciences, 62(6):69402, 2019. [doi]

Abstract

Abstract is missing.