Jing Xie, Vijaykrishnan Narayanan, Yuan Xie. Mitigating electromigration of power supply networks using bidirectional current stress. In Erik Brunvard, Ken Stevens, Joseph R. Cavallaro, Tong Zhang 0002, editors, Great Lakes Symposium on VLSI 2012, GLSVLSI'12, Salt Lake Cit, UT, USA, May 3-4, 2012. pages 299-302, ACM, 2012. [doi]
Abstract is missing.