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Test coverage metrics for the network

Xieyang Xu, Ryan Beckett, Karthick Jayaraman, Ratul Mahajan, David Walker. Test coverage metrics for the network. In Fernando A. Kuipers, Matthew C. Caesar, editors, ACM SIGCOMM 2021 Conference, Virtual Event, USA, August 23-27, 2021. pages 775-787, ACM, 2021. [doi]

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