Jun Xu, Shuo Chen, Zbigniew Kalbarczyk, Ravishankar K. Iyer. An Experimental Study of Security Vulnerabilities Caused by Errors. In 2001 International Conference on Dependable Systems and Networks (DSN 2001) (formerly: FTCS), 1-4 July 2001, Göteborg, Sweden, Proceedings. pages 421-432, IEEE Computer Society, 2001. [doi]
Abstract is missing.