Long Xu, Johan H. Huijsing, Kofi A. A. Makinwa. 2 FOM in 0.18μm BCD CMOS. In 7th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2017, Vieste, Italy, June 15-16, 2017. pages 180-182, IEEE, 2017. [doi]
@inproceedings{XuHM17-0, title = {2 FOM in 0.18μm BCD CMOS}, author = {Long Xu and Johan H. Huijsing and Kofi A. A. Makinwa}, year = {2017}, doi = {10.1109/IWASI.2017.7974246}, url = {https://doi.org/10.1109/IWASI.2017.7974246}, researchr = {https://researchr.org/publication/XuHM17-0}, cites = {0}, citedby = {0}, pages = {180-182}, booktitle = {7th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2017, Vieste, Italy, June 15-16, 2017}, publisher = {IEEE}, isbn = {978-1-5090-6707-7}, }