Jie Xu, Lei Luo, Cheng Deng, Heng Huang. Bilevel Distance Metric Learning for Robust Image Recognition. In Samy Bengio, Hanna M. Wallach, Hugo Larochelle, Kristen Grauman, Nicolò Cesa-Bianchi, Roman Garnett, editors, Advances in Neural Information Processing Systems 31: Annual Conference on Neural Information Processing Systems 2018, NeurIPS 2018, 3-8 December 2018, Montréal, Canada. pages 4202-4211, 2018. [doi]
Abstract is missing.