Leakage Increase of Narrow and Short BCPMOS

Y. Z. Xu, O. Pohland, C. Cai, H. Puchner. Leakage Increase of Narrow and Short BCPMOS. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 51-54, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.