Zhoulong Xu, Bo Tao, Zunxu Liu. Mechanical stability analysis of organic thin film transistors considering interfacial delamination. In 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2013, Suzhou, China, April 7-10, 2013. pages 973-977, IEEE, 2013. [doi]
Abstract is missing.