Mechanical stability analysis of organic thin film transistors considering interfacial delamination

Zhoulong Xu, Bo Tao, Zunxu Liu. Mechanical stability analysis of organic thin film transistors considering interfacial delamination. In 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2013, Suzhou, China, April 7-10, 2013. pages 973-977, IEEE, 2013. [doi]

Abstract

Abstract is missing.