New Challenge of Protecting Privacy due to Stained Recognition

Lining Xu, Yongxu Wu. New Challenge of Protecting Privacy due to Stained Recognition. In 40th IEEE Annual Computer Software and Applications Conference, COMPSAC Workshops 2016, Atlanta, GA, USA, June 10-14, 2016. pages 406-409, IEEE, 2016. [doi]

Abstract

Abstract is missing.