Characterization and Test of Intermittent Over RESET in RRAMs

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui. Characterization and Test of Intermittent Over RESET in RRAMs. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]

@inproceedings{XunFYAHCPTH23,
  title = {Characterization and Test of Intermittent Over RESET in RRAMs},
  author = {Hanzhi Xun and Moritz Fieback and Sicong Yuan and Hassen Aziza and Mathijs Heidekamp and Thiago Copetti and Letícia Maria Veiras Bolzani Poehls and Mottaqiallah Taouil and Said Hamdioui},
  year = {2023},
  doi = {10.1109/ATS59501.2023.10317990},
  url = {https://doi.org/10.1109/ATS59501.2023.10317990},
  researchr = {https://researchr.org/publication/XunFYAHCPTH23},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0310-0},
}