Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui. Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

Abstract is missing.