Lu Yin. Beyond Labels: Knowledge Elicitation using Deep Metric Learning and Psychometric Testing. In Christian Bessiere, editor, Proceedings of the Twenty-Ninth International Joint Conference on Artificial Intelligence, IJCAI 2020 [scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic]. pages 5214-5215, ijcai.org, 2020. [doi]
Abstract is missing.