Michitarou Yabuuchi, Kazutoshi Kobayashi. Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations. In Jinian Bian, Qiang Zhou, Peter Athanas, Yajun Ha, Kang Zhao, editors, Proceedings of the International Conference on Field-Programmable Technology, FPT 2010, 8-10 December 2010, Tsinghua University, Beijing, China. pages 417-420, IEEE, 2010. [doi]
Abstract is missing.