A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM

Nandakishor Yadav, Shikha Jain, Manisha Pattanaik, G. K. Sharma. A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Microelectronics Reliability, 55(8):1131-1143, 2015. [doi]

Abstract

Abstract is missing.