Integration of Japanese Medical Device Adverse Event Terminologies

Ayako Yagahara, Takumi Tanikawa, Katsuhiko Ogasawara, Hideto Yokoi. Integration of Japanese Medical Device Adverse Event Terminologies. In Adi V. Gundlapalli, Marie-Christine Jaulent, Dongsheng Zhao, editors, MEDINFO 2017: Precision Healthcare through Informatics - Proceedings of the 16th World Congress on Medical and Health Informatics, Hangzhou, China, 21-25 August 2017. Volume 245 of Studies in Health Technology and Informatics, pages 1345, IOS Press, 2017. [doi]

Abstract

Abstract is missing.