Optical gating width variability using electrode parasitic capacitance

Atsushi Yamada, Yasuaki Nagashima, Shinichi Onuki, Yoshiharu Shimose, Akihito Otani, Kenji Kawano. Optical gating width variability using electrode parasitic capacitance. IEICE Electronic Express, 13(11):20160363, 2016. [doi]

Abstract

Abstract is missing.