Vector Memory Expansion System For T33xx Logic Tester

Kazuhiro Yamada, Yoshikazu Takahashi. Vector Memory Expansion System For T33xx Logic Tester. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 392, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.