Special session 12B: Panel post-silicon validation & test in huge variance era

Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas. Special session 12B: Panel post-silicon validation & test in huge variance era. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]

Abstract

Abstract is missing.