Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma. A new method for measuring alias-free aperture jitter in an ADC output. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.