Kunihiko Yamaguchi, Hiroaki Nanbu, Kazuo Kanetani, Noriyuki Homma, Tohru Nakamura, Kenichi Ohhata, Akihisa Uchida, Katsumi Ogiue. An experimental soft-error-immune 64-kbit 3-ns ECL bipolar RAM. J. Solid-State Circuits, 24(5):1390-1396, October 1989. [doi]
Abstract is missing.