Kunihiko Yamaguchi, Hiroaki Nanbu, Kazuo Kanetani, Noriyuki Homma, Tohru Nakamura, Kenichi Ohhata, Akihisa Uchida, Katsumi Ogiue. An experimental soft-error-immune 64-kbit 3-ns ECL bipolar RAM. J. Solid-State Circuits, 24(5):1390-1396, October 1989. [doi]
@article{YamaguchiNKHNOUO89,
title = {An experimental soft-error-immune 64-kbit 3-ns ECL bipolar RAM},
author = {Kunihiko Yamaguchi and Hiroaki Nanbu and Kazuo Kanetani and Noriyuki Homma and Tohru Nakamura and Kenichi Ohhata and Akihisa Uchida and Katsumi Ogiue},
year = {1989},
month = {October},
doi = {10.1109/JSSC.1989.572620},
url = {https://doi.org/10.1109/JSSC.1989.572620},
researchr = {https://researchr.org/publication/YamaguchiNKHNOUO89},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {24},
number = {5},
pages = {1390-1396},
}