Dynamic Testing of ADCs Using Wavelet Transforms

Takahiro J. Yamaguchi, Mani Soma. Dynamic Testing of ADCs Using Wavelet Transforms. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 379-388, IEEE Computer Society, 1997.

Authors

Takahiro J. Yamaguchi

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Mani Soma

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