Dynamic Testing of ADCs Using Wavelet Transforms

Takahiro J. Yamaguchi, Mani Soma. Dynamic Testing of ADCs Using Wavelet Transforms. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 379-388, IEEE Computer Society, 1997.

@inproceedings{YamaguchiS97,
  title = {Dynamic Testing of ADCs Using Wavelet Transforms},
  author = {Takahiro J. Yamaguchi and Mani Soma},
  year = {1997},
  tags = {testing},
  researchr = {https://researchr.org/publication/YamaguchiS97},
  cites = {0},
  citedby = {0},
  pages = {379-388},
  booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-4209-7},
}