Kaname Yamasaki, Iwao Suzuki, Azumi Kobayashi, Keiichi Horie, Yasuharu Kobayashi, Hideyuki Aoki, Hideki Hayashi, Kenichi Tada, Koki Tsutsumida, Keiichi Higeta. External memory BIST for system-in-package. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
Abstract is missing.